Solid-State Electronics : Impact Factor & More
eISSN: 1879-2405pISSN: 0038-1101
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Key Metrics
CiteScore 
3.5
Impact Factor
< 5
SJR
Q2Materials Chemistry
SNIP
0.79
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Topics Covered on Solid-State Electronics
Solid-State Electronics Journal Specifications
Indexed in the following public directories
Web of Science 
Scopus 
Inspec 
SJR
| Overview | |
| Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
| Language | English |
| Frequency | Monthly |
| General Details | |
| Language | English |
| Frequency | Monthly |
| Publication Start Year | 1960 |
| Publisher URL | Visit website |
| Website URL | Visit website |
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Recently Published Papers in Solid-State Electronics
Enhanced photoresponse in Cu/n-Si Schottky photodetectors via RF sputtering: A comparative study with thermal evaporation
- 1 Jan 2026
- Solid-State Electronics
Band structure-based methodology for analysis of radiation-induced interface traps on reliability of UTB MOS devices
- 1 Jan 2026
- Solid-State Electronics
Design of high robustness DDSCR with embedded gate-controlled diodes and Schottky diodes
- 1 Jan 2026
- Solid-State Electronics
Model and parameter extraction strategy impact on the estimated values of MOSFET parameters in ohmic operation
- 1 Jan 2026
- Solid-State Electronics
Traps and radio-frequency characterization of polysilicon layer on high resistivity silicon substrate
- 1 Jan 2026
- Solid-State Electronics
Effect of PN passivation on MOSFETs performance in 28 nm FD-SOI
- 1 Jan 2026
- Solid-State Electronics
Enhanced photoresponse in Cu/n-Si Schottky photodetectors via RF sputtering: A comparative study with thermal evaporation
- 1 Jan 2026
- Solid-State Electronics
Band structure-based methodology for analysis of radiation-induced interface traps on reliability of UTB MOS devices
- 1 Jan 2026
- Solid-State Electronics
Design of high robustness DDSCR with embedded gate-controlled diodes and Schottky diodes
- 1 Jan 2026
- Solid-State Electronics
Model and parameter extraction strategy impact on the estimated values of MOSFET parameters in ohmic operation
- 1 Jan 2026
- Solid-State Electronics
Traps and radio-frequency characterization of polysilicon layer on high resistivity silicon substrate
- 1 Jan 2026
- Solid-State Electronics
Effect of PN passivation on MOSFETs performance in 28 nm FD-SOI
- 1 Jan 2026
- Solid-State Electronics
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