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Semiconductor Science and Technology : Impact Factor & More

eISSN: 1361-6641pISSN: 0268-1242

Aims and Scope of Semiconductor Science and Technology

Semiconductor Science and Technology is a peer-reviewed scientific journal covering all applied or explicitly applicable experimental and theoretical studies of the properties of semiconductors and their interfaces, devices, and packaging. The journal publishes different article types including research papers, rapid communications, and topical reviews. The editor-in-chief is Koji Ishibashi (Advanced Device Laboratory, RIKEN, Japan). The previous editors-in-chief were Kornelius Nielsch (University of Hamburg) and Laurens Molenkamp (University of Würzburg). Less

Key Metrics

CiteScore
3.8
Impact Factor
< 5
SJR
Q2Materials Chemistry
SNIP
0.71
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Topics Covered on Semiconductor Science and Technology

Semiconductor Science and Technology Journal Specifications

Indexed in the following public directories

  • Web of Science Web of Science
  • Scopus Scopus
  • Inspec Inspec
  • SJR SJR
Overview
Publisher IOP PUBLISHING LTD
Language English
Frequency Monthly
General Details
LanguageEnglish
FrequencyMonthly
Publication Start Year1986
Publisher URLVisit website
Website URLVisit website
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Recently Published Papers in Semiconductor Science and Technology

Gallium oxide Schottky diode defects and control
  • 5 May 2026
  • Semiconductor Science and Technology
Efficacy of π-gate in LDMOS for improved safe operating area and figure of merits
  • 1 May 2026
  • Semiconductor Science and Technology
Tailoring the back contact interface via SiO2 interlayer to enhance CZTSSe solar cell efficiency
  • 1 May 2026
  • Semiconductor Science and Technology
Low-frequency noise analysis in dual δ-doped InGaAs quantum well micro Hall sensors with different doping concentrations and locations
  • 1 May 2026
  • Semiconductor Science and Technology
Electrical characterization of high-k (k > 115) crystalline SrTiO3 (STO) thin film integration with GaN with nanomembrane transfer process
  • 1 May 2026
  • Semiconductor Science and Technology
Influence of aluminium incorporation on the semiconducting properties of p-type tin monoxide
  • 1 May 2026
  • Semiconductor Science and Technology
Gallium oxide Schottky diode defects and control
  • 5 May 2026
  • Semiconductor Science and Technology
Efficacy of π-gate in LDMOS for improved safe operating area and figure of merits
  • 1 May 2026
  • Semiconductor Science and Technology
Tailoring the back contact interface via SiO2 interlayer to enhance CZTSSe solar cell efficiency
  • 1 May 2026
  • Semiconductor Science and Technology
Low-frequency noise analysis in dual δ-doped InGaAs quantum well micro Hall sensors with different doping concentrations and locations
  • 1 May 2026
  • Semiconductor Science and Technology
Electrical characterization of high-k (k > 115) crystalline SrTiO3 (STO) thin film integration with GaN with nanomembrane transfer process
  • 1 May 2026
  • Semiconductor Science and Technology
Influence of aluminium incorporation on the semiconducting properties of p-type tin monoxide
  • 1 May 2026
  • Semiconductor Science and Technology

FAQs on Semiconductor Science and Technology