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Electronic Materials Letters : Impact Factor & More

eISSN: 2093-6788pISSN: 1738-8090

Key Metrics

CiteScore
4.8
H-Index
40
Impact Factor
< 5
SJR
Q2Electronic, Optical and Magnetic Materials
SNIP
0.71
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Topics Covered on Electronic Materials Letters

Electronic Materials Letters Journal Specifications

Indexed in the following public directories

  • Web of Science Web of Science
  • Scopus Scopus
  • Inspec Inspec
  • SJR SJR
Overview
Publisher KOREAN INST METALS MATERIALS
Language English
Frequency Bi-monthly
General Details
LanguageEnglish
FrequencyBi-monthly
Publication Start Year2005
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Recently Published Papers in Electronic Materials Letters

Correction: CVD Synthesis of High-quality Continuous Fe-Doped WSe2 Using a Solution-Based Precursor
  • 25 Nov 2025
  • Electronic Materials Letters
Intrinsic Transport Properties of Si-Doped In0.53Ga0.47As Revealed by Variable-Temperature Parallel Dipole Line Hall Measurements
  • 24 Nov 2025
  • Electronic Materials Letters
High Temperature Fluorescence Characteristics of YPO4: Tb3+,Ce3+ Nanophosphors and their Applications in Fingerprint Detection
  • 18 Nov 2025
  • Electronic Materials Letters
Fracture Toughness Analysis of Sputtered SiNx Thin Films by Energy-Based Nanoindentation Method
  • 15 Nov 2025
  • Electronic Materials Letters
Highly Sensitive and Robust Fiber Strain Sensor via Multiple Coating
  • 11 Nov 2025
  • Electronic Materials Letters
Cl2/Ar and Cl2/O2 Inductively Coupled Plasma Etching of (-201) β-Ga2O3
  • 6 Nov 2025
  • Electronic Materials Letters
Correction: CVD Synthesis of High-quality Continuous Fe-Doped WSe2 Using a Solution-Based Precursor
  • 25 Nov 2025
  • Electronic Materials Letters
Intrinsic Transport Properties of Si-Doped In0.53Ga0.47As Revealed by Variable-Temperature Parallel Dipole Line Hall Measurements
  • 24 Nov 2025
  • Electronic Materials Letters
High Temperature Fluorescence Characteristics of YPO4: Tb3+,Ce3+ Nanophosphors and their Applications in Fingerprint Detection
  • 18 Nov 2025
  • Electronic Materials Letters
Fracture Toughness Analysis of Sputtered SiNx Thin Films by Energy-Based Nanoindentation Method
  • 15 Nov 2025
  • Electronic Materials Letters
Highly Sensitive and Robust Fiber Strain Sensor via Multiple Coating
  • 11 Nov 2025
  • Electronic Materials Letters
Cl2/Ar and Cl2/O2 Inductively Coupled Plasma Etching of (-201) β-Ga2O3
  • 6 Nov 2025
  • Electronic Materials Letters

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