Ultramicroscopy : Impact Factor & More
eISSN: 1879-2723pISSN: 0304-3991
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Aims and Scope of Ultramicroscopy
Ultramicroscopy is an established peer-reviewed scientific journal in the field of electron microscopy. It provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences. Less
Key Metrics
CiteScore 
5.5
H-Index
131
Impact Factor
< 5
SJR
Q1Instrumentation
SNIP
1.17
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Topics Covered on Ultramicroscopy
Ultramicroscopy Journal Specifications
Indexed in the following public directories
Web of Science 
Scopus 
Inspec 
SJR
| Overview | |
| Publisher | ELSEVIER |
| Language | English |
| Frequency | Monthly |
| General Details | |
| Language | English |
| Frequency | Monthly |
| Publication Start Year | 1975 |
| Publisher URL | Visit website |
| Website URL | Visit website |
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Recently Published Papers in Ultramicroscopy
Evaluation of the reproducibility and crystal tracking precision of TEM goniometers in tomography experiments.
- 1 Apr 2026
- Ultramicroscopy
A universal FIB approach for contamination- and damage-free plan-view TEM lamellae using NaCl sacrificial layers.
- 1 Apr 2026
- Ultramicroscopy
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error.
- 1 Apr 2026
- Ultramicroscopy
STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectors.
- 1 Apr 2026
- Ultramicroscopy
Exploring the potential of simultaneous resonance in multi-frequency atomic force microscopy.
- 1 Apr 2026
- Ultramicroscopy
Morphologies of caustics studied by catastrophe charged-particle optics.
- 1 Apr 2026
- Ultramicroscopy
Evaluation of the reproducibility and crystal tracking precision of TEM goniometers in tomography experiments.
- 1 Apr 2026
- Ultramicroscopy
A universal FIB approach for contamination- and damage-free plan-view TEM lamellae using NaCl sacrificial layers.
- 1 Apr 2026
- Ultramicroscopy
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error.
- 1 Apr 2026
- Ultramicroscopy
STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectors.
- 1 Apr 2026
- Ultramicroscopy
Exploring the potential of simultaneous resonance in multi-frequency atomic force microscopy.
- 1 Apr 2026
- Ultramicroscopy
Morphologies of caustics studied by catastrophe charged-particle optics.
- 1 Apr 2026
- Ultramicroscopy
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