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EPJ Applied Physics : Impact Factor & More

eISSN: 1286-0050pISSN: 1286-0042

Key Metrics

CiteScore
1.5
H-Index
51
SJR
Q3Instrumentation
SNIP
0.41
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Topics Covered on EPJ Applied Physics

EPJ Applied Physics Journal Specifications

Indexed in the following public directories

  • Web of Science Web of Science
  • Scopus Scopus
  • Inspec Inspec
  • SJR SJR
Overview
Publisher EDP SCIENCES S A
Language English
Frequency Continuous publication
General Details
LanguageEnglish
FrequencyContinuous publication
Publication Start Year1998
Publisher URLVisit website
Website URLVisit website
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Recently Published Papers in EPJ Applied Physics

Effect of discharge parameters on mercury oxidation efficiency in pulsed corona discharge
  • 25 Feb 2026
  • The European Physical Journal Applied Physics
Morphology dependent optical properties of inorganic–organic hybrid ZnO thin films
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
Study on the luminescence enhancement of NaLaMgWO <sub>6</sub> : Eu phosphors
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
Cellulose-based metal–semiconductor field-effect transistors for paper electronics
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
Spectroscopic ellipsometric evaluation of multilayer thin-film roughness using a genetic algorithm
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
High capability of AlGaN/GaN HEMT transistors through innovative vertical field plates
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
Effect of discharge parameters on mercury oxidation efficiency in pulsed corona discharge
  • 25 Feb 2026
  • The European Physical Journal Applied Physics
Morphology dependent optical properties of inorganic–organic hybrid ZnO thin films
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
Study on the luminescence enhancement of NaLaMgWO <sub>6</sub> : Eu phosphors
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
Cellulose-based metal–semiconductor field-effect transistors for paper electronics
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
Spectroscopic ellipsometric evaluation of multilayer thin-film roughness using a genetic algorithm
  • 1 Jan 2026
  • The European Physical Journal Applied Physics
High capability of AlGaN/GaN HEMT transistors through innovative vertical field plates
  • 1 Jan 2026
  • The European Physical Journal Applied Physics

FAQs on EPJ Applied Physics