Surface Topography: Metrology and Properties : Impact Factor & More
eISSN: 2051-672XpISSN: 2051-672X
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Key Metrics
CiteScore 
2.4
Impact Factor
< 5
SNIP
0.62
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Surface Topography: Metrology and Properties Journal Specifications
Indexed in the following public directories
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SJR
| Overview | |
| Publisher | IOP PUBLISHING LTD |
| Language | English |
| Frequency | Quarterly |
| General Details | |
| Language | English |
| Frequency | Quarterly |
| Publication Start Year | 2013 |
| Publisher URL | Visit website |
| Website URL | Visit website |
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