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Nanomanufacturing and Metrology : Impact Factor & More

eISSN: 2520-8128pISSN: 2520-811X

Key Metrics

CiteScore
6.2
SJR
Q1Mechanical Engineering
SNIP
1.54
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Nanomanufacturing and Metrology Journal Specifications

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Publisher Springer Nature

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Recently Published Papers in Nanomanufacturing and Metrology

Fabrication of Two-Dimensional Micropattern Structures through Active Wavefront Control in Laser Interference Lithography
  • 16 Oct 2026
  • Nanomanufacturing and Metrology
Form Measurement of a 300 mm Ellipsoidal Binary Grating Using a Spatio-Temporal Fourier Method
  • 9 Oct 2026
  • Nanomanufacturing and Metrology
Opto-Biological Modulation System for the Precision Manufacturing and Evaluation of Myopia-Control Spectacle Lenses
  • 1 Oct 2026
  • Nanomanufacturing and Metrology
Plasma-Based Atom-Selective Etching: Advancing Atomic-Scale Smooth Surface Manufacturing for Semiconductor Materials
  • 24 Sep 2026
  • Nanomanufacturing and Metrology
Confined Electrodeposition in Localized Liquid Electrolyte Microzones for Microscale Metal Additive Manufacturing
  • 24 Sep 2026
  • Nanomanufacturing and Metrology
Manufacturing Paradigm III—From Conception to the Academic Frontier
  • 21 Sep 2026
  • Nanomanufacturing and Metrology
Fabrication of Two-Dimensional Micropattern Structures through Active Wavefront Control in Laser Interference Lithography
  • 16 Oct 2026
  • Nanomanufacturing and Metrology
Form Measurement of a 300 mm Ellipsoidal Binary Grating Using a Spatio-Temporal Fourier Method
  • 9 Oct 2026
  • Nanomanufacturing and Metrology
Opto-Biological Modulation System for the Precision Manufacturing and Evaluation of Myopia-Control Spectacle Lenses
  • 1 Oct 2026
  • Nanomanufacturing and Metrology
Plasma-Based Atom-Selective Etching: Advancing Atomic-Scale Smooth Surface Manufacturing for Semiconductor Materials
  • 24 Sep 2026
  • Nanomanufacturing and Metrology
Confined Electrodeposition in Localized Liquid Electrolyte Microzones for Microscale Metal Additive Manufacturing
  • 24 Sep 2026
  • Nanomanufacturing and Metrology
Manufacturing Paradigm III—From Conception to the Academic Frontier
  • 21 Sep 2026
  • Nanomanufacturing and Metrology

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