Key Metrics
CiteScore 

6.2
SJR 

Q1Mechanical Engineering

SNIP 

1.54
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Topics Covered on Nanomanufacturing and Metrology
Nanomanufacturing and Metrology Journal Specifications
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| Publisher | Springer Nature |
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Recently Published Papers in Nanomanufacturing and Metrology
Fabrication of Two-Dimensional Micropattern Structures through Active Wavefront Control in Laser Interference Lithography
- 16 Oct 2026
- Nanomanufacturing and Metrology
Form Measurement of a 300 mm Ellipsoidal Binary Grating Using a Spatio-Temporal Fourier Method
- 9 Oct 2026
- Nanomanufacturing and Metrology
Opto-Biological Modulation System for the Precision Manufacturing and Evaluation of Myopia-Control Spectacle Lenses
- 1 Oct 2026
- Nanomanufacturing and Metrology
Plasma-Based Atom-Selective Etching: Advancing Atomic-Scale Smooth Surface Manufacturing for Semiconductor Materials
- 24 Sep 2026
- Nanomanufacturing and Metrology
Confined Electrodeposition in Localized Liquid Electrolyte Microzones for Microscale Metal Additive Manufacturing
- 24 Sep 2026
- Nanomanufacturing and Metrology
Manufacturing Paradigm III—From Conception to the Academic Frontier
- 21 Sep 2026
- Nanomanufacturing and Metrology
Fabrication of Two-Dimensional Micropattern Structures through Active Wavefront Control in Laser Interference Lithography
- 16 Oct 2026
- Nanomanufacturing and Metrology
Form Measurement of a 300 mm Ellipsoidal Binary Grating Using a Spatio-Temporal Fourier Method
- 9 Oct 2026
- Nanomanufacturing and Metrology
Opto-Biological Modulation System for the Precision Manufacturing and Evaluation of Myopia-Control Spectacle Lenses
- 1 Oct 2026
- Nanomanufacturing and Metrology
Plasma-Based Atom-Selective Etching: Advancing Atomic-Scale Smooth Surface Manufacturing for Semiconductor Materials
- 24 Sep 2026
- Nanomanufacturing and Metrology
Confined Electrodeposition in Localized Liquid Electrolyte Microzones for Microscale Metal Additive Manufacturing
- 24 Sep 2026
- Nanomanufacturing and Metrology
Manufacturing Paradigm III—From Conception to the Academic Frontier
- 21 Sep 2026
- Nanomanufacturing and Metrology