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Microelectronics Reliability : Impact Factor & More

eISSN: 1872-941XpISSN: 0026-2714

Key Metrics

CiteScore
3.5
Impact Factor
< 5
SJR
Q2Condensed Matter Physics
SNIP
0.85
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Microelectronics Reliability Journal Specifications

Indexed in the following public directories

  • Web of Science Web of Science
  • Inspec Inspec
Overview
Publisher PERGAMON-ELSEVIER SCIENCE LTD
Language English
Frequency Monthly
General Details
LanguageEnglish
FrequencyMonthly
Publication Start Year1962
Publisher URLVisit website
Website URLVisit website
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Recently Published Papers in Microelectronics Reliability

Optimizing the capacitor insulator to enhance the bias-stress characteristics of LTPS-TFTs for improving the reliability of low-temperature polycrystalline-silicon active matrix organic light-emitting diodes
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A new online monitoring method to detect thermal resistance via turbo sampling of plateau voltage
  • 1 Jun 2026
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Advanced semiconductor packaging design via artificial intelligence and machine learning: A review
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Thermo–vibration coupled reliability methodology of BGA solder joints considering the preload effect of heat sink bolts
  • 1 Jun 2026
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Copula based SFP+ transceiver MTTF estimation method by using optical power and sensitivity
  • 1 Jun 2026
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Toward stable FeFET multi-level cell operations using novel weight freezing methodology with recovery cycling scheme for neuromorphic applications
  • 1 Jun 2026
  • Microelectronics Reliability
Optimizing the capacitor insulator to enhance the bias-stress characteristics of LTPS-TFTs for improving the reliability of low-temperature polycrystalline-silicon active matrix organic light-emitting diodes
  • 1 Jul 2026
  • Microelectronics Reliability
A new online monitoring method to detect thermal resistance via turbo sampling of plateau voltage
  • 1 Jun 2026
  • Microelectronics Reliability
Advanced semiconductor packaging design via artificial intelligence and machine learning: A review
  • 1 Jun 2026
  • Microelectronics Reliability
Thermo–vibration coupled reliability methodology of BGA solder joints considering the preload effect of heat sink bolts
  • 1 Jun 2026
  • Microelectronics Reliability
Copula based SFP+ transceiver MTTF estimation method by using optical power and sensitivity
  • 1 Jun 2026
  • Microelectronics Reliability
Toward stable FeFET multi-level cell operations using novel weight freezing methodology with recovery cycling scheme for neuromorphic applications
  • 1 Jun 2026
  • Microelectronics Reliability

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