Microelectronics Reliability Key Metrics
CiteScore
3.5
Impact Factor
< 5
SJR
Q2Condensed Matter Physics
SNIP
0.85
Time to Publish
View Chart
4 Mo
Microelectronics Reliability Journal Specifications
Overview | |
Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
Language | English |
Frequency | Monthly |
General Details | |
Language | English |
Frequency | Monthly |
Publication Start Year | 1962 |
Publisher URL | Visit website |
Website URL | Visit website |
View less
Time to Publish
% of papers by time taken from submission to publication
0 to 3 months12%
4 to 6 months60%
7 to 9 months18%
Above 9 months10%
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Check my PaperRecently Published Papers in Microelectronics Reliability
Inside front cover - Editorial board
- 1 May 2015
- Microelectronics Reliability
Development of embedded piezoelectric acoustic sensor array architecture
- 1 Jun 2010
- Microelectronics Reliability
Moisture effect on the dielectric and structure of BaTiO3-based devices
- 1 Jun 2010
- Microelectronics Reliability
Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances
- 1 Jun 2010
- Microelectronics Reliability
Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
- 1 Jun 2010
- Microelectronics Reliability
Functional fluid jetting performance optimization
- 1 Jun 2010
- Microelectronics Reliability
Inside front cover - Editorial board
- 1 May 2015
- Microelectronics Reliability
Development of embedded piezoelectric acoustic sensor array architecture
- 1 Jun 2010
- Microelectronics Reliability
Moisture effect on the dielectric and structure of BaTiO3-based devices
- 1 Jun 2010
- Microelectronics Reliability
Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances
- 1 Jun 2010
- Microelectronics Reliability
Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
- 1 Jun 2010
- Microelectronics Reliability
Functional fluid jetting performance optimization
- 1 Jun 2010
- Microelectronics Reliability
FAQs on Microelectronics Reliability
How long has Microelectronics Reliability been actively publishing?
Microelectronics Reliability has been in operation since 1962 till date.
What is the publishing frequency of Microelectronics Reliability?
Microelectronics Reliability published with a Monthly frequency.
How many articles did Microelectronics Reliability publish last year?
In 2023, Microelectronics Reliability publsihed undefined articles.
What is the eISSN & pISSN for Microelectronics Reliability?
For Microelectronics Reliability, eISSN is 1872-941X and pISSN is 0026-2714.
What is Citescore for Microelectronics Reliability?
Citescore for Microelectronics Reliability is 3.5.
What is SNIP score for Microelectronics Reliability?
SNIP score for Microelectronics Reliability is 0.85.
What is the SJR for Microelectronics Reliability?
SJR for Microelectronics Reliability is Q2.
Who is the publisher of Microelectronics Reliability?
PERGAMON-ELSEVIER SCIENCE LTD is the publisher of Microelectronics Reliability.