Key Metrics
CiteScore 

3.5
Impact Factor 

< 5
SJR 

Q2Condensed Matter Physics

SNIP 

0.85
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Microelectronics Reliability Journal Specifications
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Web of Science
Inspec
| Overview | |
| Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
| Language | English |
| Frequency | Monthly |
| General Details | |
| Language | English |
| Frequency | Monthly |
| Publication Start Year | 1962 |
| Publisher URL | Visit website |
| Website URL | Visit website |
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Check my PaperRecently Published Papers in Microelectronics Reliability
Optimizing the capacitor insulator to enhance the bias-stress characteristics of LTPS-TFTs for improving the reliability of low-temperature polycrystalline-silicon active matrix organic light-emitting diodes
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Thermo–vibration coupled reliability methodology of BGA solder joints considering the preload effect of heat sink bolts
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Copula based SFP+ transceiver MTTF estimation method by using optical power and sensitivity
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Toward stable FeFET multi-level cell operations using novel weight freezing methodology with recovery cycling scheme for neuromorphic applications
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Optimizing the capacitor insulator to enhance the bias-stress characteristics of LTPS-TFTs for improving the reliability of low-temperature polycrystalline-silicon active matrix organic light-emitting diodes
- 1 Jul 2026
- Microelectronics Reliability
A new online monitoring method to detect thermal resistance via turbo sampling of plateau voltage
- 1 Jun 2026
- Microelectronics Reliability
Advanced semiconductor packaging design via artificial intelligence and machine learning: A review
- 1 Jun 2026
- Microelectronics Reliability
Thermo–vibration coupled reliability methodology of BGA solder joints considering the preload effect of heat sink bolts
- 1 Jun 2026
- Microelectronics Reliability
Copula based SFP+ transceiver MTTF estimation method by using optical power and sensitivity
- 1 Jun 2026
- Microelectronics Reliability
Toward stable FeFET multi-level cell operations using novel weight freezing methodology with recovery cycling scheme for neuromorphic applications
- 1 Jun 2026
- Microelectronics Reliability