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JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 Journal Specifications
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Inspec
| Overview | |
| Publisher | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS |
| Language | English |
| Frequency | Quarterly |
| General Details | |
| Language | English |
| Frequency | Quarterly |
| Publication Start Year | 2007 |
| Publisher URL | Visit website |
| Website URL | Visit website |
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Recently Published Papers in JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
Relating human and AI-based detection limits in scanning electron microscopy dimensional metrology
- 1 Jan 2025
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- 6 Nov 2020
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Direct comparison of line edge roughness measurements by SEM and a metrological tilting-atomic force microscopy for reference metrology
- 23 Oct 2020
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JM3 is Gone, Long Live JM3!
- 20 Oct 2020
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Particle and pattern discriminant freeze-cleaning method
- 6 Oct 2020
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Relating human and AI-based detection limits in scanning electron microscopy dimensional metrology
- 1 Jan 2025
- Journal of micro/nanolithography, MEMS, and MOEMS : JM3
Resolution enhancement with source-wavelength optimization according to illumination angle in optical lithography
- 20 Nov 2020
- Journal of Micro/Nanolithography, MEMS, and MOEMS
Rayleigh or Abbe? Origin and naming of the resolution formula of microlithography
- 6 Nov 2020
- Journal of Micro/Nanolithography, MEMS, and MOEMS
Direct comparison of line edge roughness measurements by SEM and a metrological tilting-atomic force microscopy for reference metrology
- 23 Oct 2020
- Journal of Micro/Nanolithography, MEMS, and MOEMS
JM3 is Gone, Long Live JM3!
- 20 Oct 2020
- Journal of Micro/Nanolithography, MEMS, and MOEMS
Particle and pattern discriminant freeze-cleaning method
- 6 Oct 2020
- Journal of Micro/Nanolithography, MEMS, and MOEMS
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