Key Metrics
Impact Factor 

< 5
Recommended pre-submission checks
Powered by 

JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 Journal Specifications
Indexed in the following public directories
Web of Science
Inspec
| Overview | |
| Publisher | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS |
| Language | English |
| Frequency | Quarterly |
| General Details | |
| Language | English |
| Frequency | Quarterly |
| Publication Start Year | 2007 |
| Publisher URL | Visit website |
| Website URL | Visit website |
View less
Planning to publish in JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 ?
Upload your Manuscript to get
- Degree of match
- Common matching concepts
- Additional journal recommendations
