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IEEE Transactions on Device and Materials Reliability : Impact Factor & More

eISSN: 1558-2574pISSN: 1530-4388

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IEEE Transactions on Device and Materials Reliability Key Metrics

CiteScore
3.9
Impact Factor
< 5
SNIP
1.24

Topics Covered on IEEE Transactions on Device and Materials Reliability

Electrostatic discharge
Simulation
Room temperature
Sram cell
Junction temperature
Printed circuit board
CMOS
Flash memory
Redistribution layer
Static noise margin
Nonlinear capacitance
Variable capacitor
Electrochemical migration
Current driver
Electromigration
MOSFET
Single event upset
Power grid
Gate dielectric
Breakdown voltage

IEEE Transactions on Device and Materials Reliability Journal Specifications

Indexed in the following public directories

  • Web of Science Web of Science
  • Scopus Scopus
  • Inspec Inspec
  • SJR SJR
Overview
Publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Language English
Frequency Quarterly
General Details
LanguageEnglish
FrequencyQuarterly
Publication Start Year2001
Publisher URLVisit website
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FAQs on IEEE Transactions on Device and Materials Reliability

How long has IEEE Transactions on Device and Materials Reliability been actively publishing? Faqs

IEEE Transactions on Device and Materials Reliability has been in operation since 2001 till date.

What is the publishing frequency of IEEE Transactions on Device and Materials Reliability? Faqs

IEEE Transactions on Device and Materials Reliability published with a Quarterly frequency.

How many articles did IEEE Transactions on Device and Materials Reliability publish last year? Faqs

In 2023, IEEE Transactions on Device and Materials Reliability publsihed 101 articles.

What is the eISSN & pISSN for IEEE Transactions on Device and Materials Reliability? Faqs

For IEEE Transactions on Device and Materials Reliability, eISSN is 1558-2574 and pISSN is 1530-4388.

What is Citescore for IEEE Transactions on Device and Materials Reliability? Faqs

Citescore for IEEE Transactions on Device and Materials Reliability is 3.9.

What is SNIP score for IEEE Transactions on Device and Materials Reliability? Faqs

SNIP score for IEEE Transactions on Device and Materials Reliability is 1.24.

Who is the publisher of IEEE Transactions on Device and Materials Reliability? Faqs

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC is the publisher of IEEE Transactions on Device and Materials Reliability.

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