Electronic Device Failure Analysis Key Metrics
SJR
Q4Electrical and Electronic Engineering
Electronic Device Failure Analysis Journal Specifications
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- Scopus
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Publisher | ASM International |
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Check my PaperRecently Published Papers in Electronic Device Failure Analysis
Celebrating 50 Years of ISTFA
- 1 Nov 2024
- EDFA Technical Articles
Precise Final Specimen Thinning by Concentrated Argon Ion Beam Milling of Plan View TEM Specimens Prepared in the Xenon Plasma FIB
- 1 Nov 2024
- EDFA Technical Articles
Electronically Viable TEM Samples with PFIB and STEM EBIC
- 1 Nov 2024
- EDFA Technical Articles
Four-Dimensional Scanning Transmission Electron Microscopy: Part III, Ptychography
- 1 Nov 2024
- EDFA Technical Articles
Nondestructive 3D X-ray Microscopy Speeds Throughput in New Failure Analysis Workflows
- 1 Nov 2024
- EDFA Technical Articles
Assessing Compatibility of Advanced IC Packages to X-ray Based Physical Inspection
- 1 Aug 2024
- EDFA Technical Articles
Celebrating 50 Years of ISTFA
- 1 Nov 2024
- EDFA Technical Articles
Precise Final Specimen Thinning by Concentrated Argon Ion Beam Milling of Plan View TEM Specimens Prepared in the Xenon Plasma FIB
- 1 Nov 2024
- EDFA Technical Articles
Electronically Viable TEM Samples with PFIB and STEM EBIC
- 1 Nov 2024
- EDFA Technical Articles
Four-Dimensional Scanning Transmission Electron Microscopy: Part III, Ptychography
- 1 Nov 2024
- EDFA Technical Articles
Nondestructive 3D X-ray Microscopy Speeds Throughput in New Failure Analysis Workflows
- 1 Nov 2024
- EDFA Technical Articles
Assessing Compatibility of Advanced IC Packages to X-ray Based Physical Inspection
- 1 Aug 2024
- EDFA Technical Articles
FAQs on Electronic Device Failure Analysis
How many articles did Electronic Device Failure Analysis publish last year?
In 2024, Electronic Device Failure Analysis publsihed 19 articles.
What is the SJR for Electronic Device Failure Analysis?
SJR for Electronic Device Failure Analysis is Q4.
Who is the publisher of Electronic Device Failure Analysis?
ASM International is the publisher of Electronic Device Failure Analysis.