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Studies in Applied Electromagnetics and Mechanics : Impact Factor & More
eISSN: 1879-8322pISSN: 1383-7281
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Studies in Applied Electromagnetics and Mechanics Key Metrics
CiteScore 
0.5
H-Index
10
SJR
Q4Mechanical Engineering
SNIP
0.18
Studies in Applied Electromagnetics and Mechanics Journal Specifications
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SJR
| Overview | |
| Publisher | IOS Press |
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Recently Published Papers in Studies in Applied Electromagnetics and Mechanics
Focal Plane Characterization of Spot Focusing Horn Antennas for Free Space Microwave Dielectric NDE
- 1 Jan 2019
- Studies in applied electromagnetics and mechanics
Focal Plane Characterization of Spot Focusing Horn Antennas for Free Space Microwave Dielectric NDE
- 1 Jan 2019
- Studies in applied electromagnetics and mechanics
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Compare journals across 7 parameters SJR Ranking, Topics covered, Indexing Database, Publication Review Time, Publication Type, Article Processing Charges & Recently Published papers
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FAQs on Studies in Applied Electromagnetics and Mechanics
How many articles did Studies in Applied Electromagnetics and Mechanics publish last year? 
In 2024, Studies in Applied Electromagnetics and Mechanics publsihed undefined articles.
What is the eISSN & pISSN for Studies in Applied Electromagnetics and Mechanics?
For Studies in Applied Electromagnetics and Mechanics, eISSN is 1879-8322 and pISSN is 1383-7281.
What is Citescore for Studies in Applied Electromagnetics and Mechanics?
Citescore for Studies in Applied Electromagnetics and Mechanics is 0.5.
What is the H Index for Studies in Applied Electromagnetics and Mechanics ?
H Index for Studies in Applied Electromagnetics and Mechanics is 10.
What is SNIP score for Studies in Applied Electromagnetics and Mechanics?
SNIP score for Studies in Applied Electromagnetics and Mechanics is 0.18.
What is the SJR for Studies in Applied Electromagnetics and Mechanics?
SJR for Studies in Applied Electromagnetics and Mechanics is Q4.
Who is the publisher of Studies in Applied Electromagnetics and Mechanics?
IOS Press is the publisher of Studies in Applied Electromagnetics and Mechanics.
