Electronic Device Failure Analysis Key Metrics
SJR
Q4Electrical and Electronic Engineering
Electronic Device Failure Analysis Journal Specifications
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- Scopus
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Publisher | ASM International |
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Check my PaperRecently Published Papers in Electronic Device Failure Analysis
Differential Laser Voltage Probe: A Brief Overview and Thoughts on What Could Come Next
- 1 May 2024
- EDFA Technical Articles
A Short Summary of the First Chips Metrology Workshop on Failure Analysis and Reliability Testing
- 1 May 2024
- EDFA Technical Articles
Microstructural Hierarchy Descriptor Enabling Interpretative AI for Microelectronic Failure Analysis
- 1 May 2024
- EDFA Technical Articles
Scanning Thermal Microscopy for Localizing and Monitoring Defects in Electronics
- 1 May 2024
- EDFA Technical Articles
Electro-Thermal Simulation and Reliability of a Ball Grid Array
- 1 May 2024
- EDFA Technical Articles
Four-Dimensional Scanning Transmission Electron Microscopy: Part II, Crystal Orientation and Phase, Short and Medium Range Order, and Electromagnetic Fields
- 1 Feb 2024
- EDFA Technical Articles
Differential Laser Voltage Probe: A Brief Overview and Thoughts on What Could Come Next
- 1 May 2024
- EDFA Technical Articles
A Short Summary of the First Chips Metrology Workshop on Failure Analysis and Reliability Testing
- 1 May 2024
- EDFA Technical Articles
Microstructural Hierarchy Descriptor Enabling Interpretative AI for Microelectronic Failure Analysis
- 1 May 2024
- EDFA Technical Articles
Scanning Thermal Microscopy for Localizing and Monitoring Defects in Electronics
- 1 May 2024
- EDFA Technical Articles
Electro-Thermal Simulation and Reliability of a Ball Grid Array
- 1 May 2024
- EDFA Technical Articles
Four-Dimensional Scanning Transmission Electron Microscopy: Part II, Crystal Orientation and Phase, Short and Medium Range Order, and Electromagnetic Fields
- 1 Feb 2024
- EDFA Technical Articles
FAQs on Electronic Device Failure Analysis
How many articles did Electronic Device Failure Analysis publish last year?
In 2023, Electronic Device Failure Analysis publsihed 19 articles.
What is the SJR for Electronic Device Failure Analysis?
SJR for Electronic Device Failure Analysis is Q4.
Who is the publisher of Electronic Device Failure Analysis?
ASM International is the publisher of Electronic Device Failure Analysis.