IEEE Transactions on Device and Materials Reliability : Impact Factor & More
eISSN: 1558-2574pISSN: 1530-4388
Share this on:
Key Metrics
CiteScore 
3.9
Impact Factor
< 5
SNIP
1.24
Recommended pre-submission checks
Powered by 
Run standard language and technical checks to improve your manuscript – before you submit
Technical Compliance
Ensure manuscript complies with standard submission guidelines.
Language Quality
Improve clarity, grammar, and academic writing style.
A comprehensive report covering all these checks awaits you.
Topics Covered on IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability Journal Specifications
Indexed in the following public directories
Web of Science 
Scopus 
Inspec 
SJR
| Overview | |
| Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| Language | English |
| Frequency | Quarterly |
| General Details |
View less
Planning to publish in IEEE Transactions on Device and Materials Reliability ?
Upload your Manuscript to get
- Degree of match
- Common matching concepts
- Additional journal recommendations
Recently Published Papers in IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability Publication Information
- 1 Mar 2026
- IEEE Transactions on Device and Materials Reliability
Table of Contents
- 1 Mar 2026
- IEEE Transactions on Device and Materials Reliability
Capacitor-Coupled Offset-Canceled DRAM Sense Amplifier With Ultralow Offset Voltage and Hidden Cancellation Time
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
Simulation of the Single Event Burnout in Lateral Enhancement mode β-Ga <sub>2</sub> O <sub>3</sub> MOSFET Devices
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
A Process-Robust Split-Gate eFlash Memory with Spacer-Defined Floating Gate in 55-nm Node
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability Publication Information
- 1 Mar 2026
- IEEE Transactions on Device and Materials Reliability
Table of Contents
- 1 Mar 2026
- IEEE Transactions on Device and Materials Reliability
Capacitor-Coupled Offset-Canceled DRAM Sense Amplifier With Ultralow Offset Voltage and Hidden Cancellation Time
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
Simulation of the Single Event Burnout in Lateral Enhancement mode β-Ga <sub>2</sub> O <sub>3</sub> MOSFET Devices
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
A Process-Robust Split-Gate eFlash Memory with Spacer-Defined Floating Gate in 55-nm Node
- 1 Jan 2026
- IEEE Transactions on Device and Materials Reliability
FAQs on IEEE Transactions on Device and Materials Reliability
How long has IEEE Transactions on Device and Materials Reliability been actively publishing? 
What is the publishing frequency of IEEE Transactions on Device and Materials Reliability?
How many articles did IEEE Transactions on Device and Materials Reliability publish last year?
What is the eISSN & pISSN for IEEE Transactions on Device and Materials Reliability?
What is Citescore for IEEE Transactions on Device and Materials Reliability?
What is SNIP score for IEEE Transactions on Device and Materials Reliability?
Who is the publisher of IEEE Transactions on Device and Materials Reliability?
