Microelectronics Reliability: Impact Factor, Ranking, H-Index, ISSN, CiteScore, SJR and Other Key Journal Metrics | Researcher.Life

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Scope & Metrics
Journal Specification
Published Literature
FAQs

Microelectronics Reliability Key Metrics

CiteScore

3.5

Impact Factor

< 5

SJR

Q2Condensed Matter Physics

SNIP

0.85

Time to Accept

2

Mo

Time to Publish

View Chart

4

Mo

Time to Publish

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% of papers by time taken from submission to publication

0 to 3 months

22%

4 to 6 months

65%

7 to 9 months

7%

Above 9 months

6%

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Microelectronics Reliability Journal Specifications

Indexed in the following public directories

Web of Science
Inspec

Overview
Publisher	PERGAMON-ELSEVIER SCIENCE LTD
Language	English
Frequency	Monthly
General Details
Language	English
Frequency	Monthly
Publication Start Year	1962
Publisher URL	Visit website
Website URL	Visit website

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Recently Published Papers in Microelectronics Reliability

Effect of thermal cycling on microstructure and mechanical properties of nano-silver microsolder joint

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

Failure analysis of GaN-based optoelectronic devices: Insights into photo-induced electrochemical migration

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

New temperature-independent aging indicator for power semiconductor devices – Application to IGBTs

1 Jan 2025
Microelectronics Reliability

PDFをダウンロードフルペーパーを表示

A study of UIS ruggedness of mismatched paralleled SiC MOSFETs

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

Mitigating solder voids in quad flat no-lead components: A vacuum reflow approach

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

Evolution mechanism of cold adhesion force between electrical contact determined by coating hardness

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

Effect of thermal cycling on microstructure and mechanical properties of nano-silver microsolder joint

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

Failure analysis of GaN-based optoelectronic devices: Insights into photo-induced electrochemical migration

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

New temperature-independent aging indicator for power semiconductor devices – Application to IGBTs

1 Jan 2025
Microelectronics Reliability

PDFをダウンロードフルペーパーを表示

A study of UIS ruggedness of mismatched paralleled SiC MOSFETs

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

Mitigating solder voids in quad flat no-lead components: A vacuum reflow approach

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

Evolution mechanism of cold adhesion force between electrical contact determined by coating hardness

1 Jan 2025
Microelectronics Reliability

フルペーパーを表示

View all papers for this journal

FAQs on Microelectronics Reliability

How long has Microelectronics Reliability been actively publishing?

Microelectronics Reliability has been in operation since 1962 till date.

What is the publishing frequency of Microelectronics Reliability?

Microelectronics Reliability published with a Monthly frequency.

How many articles did Microelectronics Reliability publish last year?

In 2023, Microelectronics Reliability publsihed 326 articles.

What is the eISSN & pISSN for Microelectronics Reliability?

For Microelectronics Reliability, eISSN is 1872-941X and pISSN is 0026-2714.

What is Citescore for Microelectronics Reliability?

Citescore for Microelectronics Reliability is 3.5.

What is SNIP score for Microelectronics Reliability?

SNIP score for Microelectronics Reliability is 0.85.

What is the SJR for Microelectronics Reliability?

SJR for Microelectronics Reliability is Q2.

Who is the publisher of Microelectronics Reliability?

PERGAMON-ELSEVIER SCIENCE LTD is the publisher of Microelectronics Reliability.

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