Microelectronics Reliability Key Metrics
CiteScore
3.5
Impact Factor
< 5
SJR
Q2Condensed Matter Physics
SNIP
0.85
Time to Publish
View Chart
4 Mo
Microelectronics Reliability Journal Specifications
Overview | |
Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
Language | English |
Frequency | Monthly |
General Details | |
Language | English |
Frequency | Monthly |
Publication Start Year | 1962 |
Publisher URL | Visit website |
Website URL | Visit website |
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Time to Publish
% of papers by time taken from submission to publication
0 to 3 months12%
4 to 6 months60%
7 to 9 months18%
Above 9 months10%
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Check my PaperRecently Published Papers in Microelectronics Reliability
Investigation on the microstructure, mechanical properties and chlorine resistance of fine aluminum alloy wires
- 1 Nov 2024
- Microelectronics Reliability
A machine learning approach to accelerate reliability prediction in nanowire FETs from self-heating perspective
- 1 Oct 2024
- Microelectronics Reliability
Enhancing flexible electronics: Unveiling the role of strain rate in the performance of molybdenum-coated PET films
- 1 Oct 2024
- Microelectronics Reliability
The sensitivity analysis of geometric parameters on the power cycling reliability of bond wires
- 1 Oct 2024
- Microelectronics Reliability
Editorial Board
- 1 Oct 2024
- Microelectronics Reliability
Revisiting the effectiveness of diamond heat spreaders on multi-finger gate GaN HEMT using chip-to-package-level thermal simulation
- 1 Oct 2024
- Microelectronics Reliability
Investigation on the microstructure, mechanical properties and chlorine resistance of fine aluminum alloy wires
- 1 Nov 2024
- Microelectronics Reliability
A machine learning approach to accelerate reliability prediction in nanowire FETs from self-heating perspective
- 1 Oct 2024
- Microelectronics Reliability
Enhancing flexible electronics: Unveiling the role of strain rate in the performance of molybdenum-coated PET films
- 1 Oct 2024
- Microelectronics Reliability
The sensitivity analysis of geometric parameters on the power cycling reliability of bond wires
- 1 Oct 2024
- Microelectronics Reliability
Editorial Board
- 1 Oct 2024
- Microelectronics Reliability
Revisiting the effectiveness of diamond heat spreaders on multi-finger gate GaN HEMT using chip-to-package-level thermal simulation
- 1 Oct 2024
- Microelectronics Reliability
FAQs on Microelectronics Reliability
How long has Microelectronics Reliability been actively publishing?
Microelectronics Reliability has been in operation since 1962 till date.
What is the publishing frequency of Microelectronics Reliability?
Microelectronics Reliability published with a Monthly frequency.
How many articles did Microelectronics Reliability publish last year?
In 2023, Microelectronics Reliability publsihed 326 articles.
What is the eISSN & pISSN for Microelectronics Reliability?
For Microelectronics Reliability, eISSN is 1872-941X and pISSN is 0026-2714.
What is Citescore for Microelectronics Reliability?
Citescore for Microelectronics Reliability is 3.5.
What is SNIP score for Microelectronics Reliability?
SNIP score for Microelectronics Reliability is 0.85.
What is the SJR for Microelectronics Reliability?
SJR for Microelectronics Reliability is Q2.
Who is the publisher of Microelectronics Reliability?
PERGAMON-ELSEVIER SCIENCE LTD is the publisher of Microelectronics Reliability.