Explore All AccessMetrology and Measurement Systems : Impact Factor & More
eISSN: 2300-1941pISSN: 0860-8229
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Metrology and Measurement Systems Key Metrics
CiteScore 
2.4
Impact Factor
< 5
SJR
Q3Instrumentation
SNIP
0.65
Metrology and Measurement Systems Journal Specifications
Indexed in the following public directories
Web of Science 
DOAJ
| Overview | |
| Publisher | POLSKA AKAD NAUK, POLISH ACAD SCIENCES |
| Language | English |
| Frequency | Quarterly |
| Publication Time | 24 |
| Editorial Review Process | Anonymous peer review |
| General Details | |
| Language | English |
| Society/Institute/Sponsor | Committee on Metrology and Scientific Instrumentation of Polish Academy of Sciences |
| Frequency | Quarterly |
| Publication Start Year | 1988 |
| Website URL | Visit website |
| Publication Details | |
| Other charges | Visit website |
| Publication Time | 24 |
| Editorial Review Detail | |
| Information for authors | |
| Author instructions | Visit website |
| Deposit Policy | Sherpa/Romeo |
| License type | CC BY-NC-ND |
| OA statement | Visit website |
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Check my PaperRecently Published Papers in Metrology and Measurement Systems
Use of TDR technique to measure grain moisture content
- 21 Nov 2024
- Metrology and Measurement Systems
Identification of step-index fibers by static light scattering
- 21 Nov 2024
- Metrology and Measurement Systems
Robust RTSs-based esprit method for low frequency oscillations analysis
- 21 Nov 2024
- Metrology and Measurement Systems
Crack detection of high-strength wind turbine bolts based on fiber bragg grating sensors
- 21 Nov 2024
- Metrology and Measurement Systems
Energy-efficient distributed estimation algorithm for wireless sensor networks based on covariance intersection with eigendecomposition
- 21 Nov 2024
- Metrology and Measurement Systems
A digital background calibration method for time-interleaved ADCs based on frequency shifting technique
- 21 Nov 2024
- Metrology and Measurement Systems
Use of TDR technique to measure grain moisture content
- 21 Nov 2024
- Metrology and Measurement Systems
Identification of step-index fibers by static light scattering
- 21 Nov 2024
- Metrology and Measurement Systems
Robust RTSs-based esprit method for low frequency oscillations analysis
- 21 Nov 2024
- Metrology and Measurement Systems
Crack detection of high-strength wind turbine bolts based on fiber bragg grating sensors
- 21 Nov 2024
- Metrology and Measurement Systems
Energy-efficient distributed estimation algorithm for wireless sensor networks based on covariance intersection with eigendecomposition
- 21 Nov 2024
- Metrology and Measurement Systems
A digital background calibration method for time-interleaved ADCs based on frequency shifting technique
- 21 Nov 2024
- Metrology and Measurement Systems
FAQs on Metrology and Measurement Systems
How long has Metrology and Measurement Systems been actively publishing? 
Metrology and Measurement Systems has been in operation since 1988 till date.
What is the publishing frequency of Metrology and Measurement Systems?
Metrology and Measurement Systems published with a Quarterly frequency.
How many articles did Metrology and Measurement Systems publish last year?
In 2023, Metrology and Measurement Systems publsihed 0 articles.
What is the eISSN & pISSN for Metrology and Measurement Systems?
For Metrology and Measurement Systems, eISSN is 2300-1941 and pISSN is 0860-8229.
What is Citescore for Metrology and Measurement Systems?
Citescore for Metrology and Measurement Systems is 2.4.
What is SNIP score for Metrology and Measurement Systems?
SNIP score for Metrology and Measurement Systems is 0.65.
What is the SJR for Metrology and Measurement Systems?
SJR for Metrology and Measurement Systems is Q3.
Who is the publisher of Metrology and Measurement Systems?
POLSKA AKAD NAUK, POLISH ACAD SCIENCES is the publisher of Metrology and Measurement Systems.
