Journal of Analysis and Testing : Impact Factor & More

eISSN: 2509-4696pISSN: 2096-241X

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Journal of Analysis and Testing Key Metrics

CiteScore
4.2
SJR
Q3Spectroscopy
SNIP
0.86
Time to Accept
2
 Mo
Time to Publish
time-to-publish View Chart
4
 Mo
Time to Publish

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% of papers by time taken from submission to publication
0 to 3 months
27%
4 to 6 months
67%
7 to 9 months
7%
Above 9 months
0%

Topics Covered on Journal of Analysis and Testing

Natural water
Plasmonic nanoparticles
Uv detection
DNA nanotechnology
Gold nanospheres
Electrochemiluminescence
Wavelength shift
Environmental water
Dielectric layer
Sequential injection analysis
Mass spectrometry

Journal of Analysis and Testing Journal Specifications

Overview
Publisher SPRINGER SINGAPORE PTE LTD
Language English
Frequency Quarterly
General Details
LanguageEnglish
FrequencyQuarterly
Publication Start Year2017
Publisher URLVisit website
Website URLVisit website
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FAQs on Journal of Analysis and Testing

How long has Journal of Analysis and Testing been actively publishing? expand

Journal of Analysis and Testing has been in operation since 2017 till date.

What is the publishing frequency of Journal of Analysis and Testing? expand

Journal of Analysis and Testing published with a Quarterly frequency.

How many articles did Journal of Analysis and Testing publish last year? expand

In 2023, Journal of Analysis and Testing publsihed 46 articles.

What is the eISSN & pISSN for Journal of Analysis and Testing? expand

For Journal of Analysis and Testing, eISSN is 2509-4696 and pISSN is 2096-241X.

What is Citescore for Journal of Analysis and Testing? expand

Citescore for Journal of Analysis and Testing is 4.2.

What is SNIP score for Journal of Analysis and Testing? expand

SNIP score for Journal of Analysis and Testing is 0.86.

What is the SJR for Journal of Analysis and Testing? expand

SJR for Journal of Analysis and Testing is Q3.

Who is the publisher of Journal of Analysis and Testing? expand

SPRINGER SINGAPORE PTE LTD is the publisher of Journal of Analysis and Testing.