CiteScore measures average citations received per document published in the serial.
SCImago Journal Rank measures weighted citations received by the serial. Citation weighting depends on subject field and prestige (SJR) of the citing serial.
Source Normalized Impact per Paper measures actual citations received relative to citations expected for the serial’s subject field.
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Check my PaperCitescore for Technical Digest - International Electron Devices Meeting is 4.6.
SNIP score for Technical Digest - International Electron Devices Meeting is 0.89.
SJR for Technical Digest - International Electron Devices Meeting is Q2.
IEEE is the publisher of Technical Digest - International Electron Devices Meeting.