CiteScore measures average citations received per document published in the serial.
Impact factor of a journal is calculated by dividing the number of current year citations to the source items published in that journal during the previous two years.
SCImago Journal Rank measures weighted citations received by the serial. Citation weighting depends on subject field and prestige (SJR) of the citing serial.
Source Normalized Impact per Paper measures actual citations received relative to citations expected for the serial’s subject field.
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
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Overview | |
Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
Language | English |
Frequency | Monthly |
General Details | |
Language | English |
Frequency | Monthly |
Publication Start Year | 1962 |
Publisher URL | Visit website |
Website URL | Visit website |
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Check my Paper30.1k articles received 59.7k citations see all
Microelectronics Reliability has been in operation since 1962 till date.
Microelectronics Reliability published with a Monthly frequency.
In 2023, Microelectronics Reliability published 326 articles.
For Microelectronics Reliability,eISSN is 1872-941X and pISSN is0026-2714.
Citescore for Microelectronics Reliability is 3.5.
SNIP score for Microelectronics Reliability is 0.85.
SJR for Microelectronics Reliability is Q2.
PERGAMON-ELSEVIER SCIENCE LTD is the publisher of Microelectronics Reliability.