Key Metrics
3.5
CiteScore
CiteScore
CiteScore measures average citations received per document published in the serial.
< 5
Impact Factor
Impact Factor
Impact factor of a journal is calculated by dividing the number of current year citations to the source items published in that journal during the previous two years.
Q2
Condensed Matter Physics
SJR
- Q2 Condensed Matter Physics
- Q2 Surfaces, Coatings and Films
- Q2 Electrical and Electronic Engineering
- Q2 Safety, Risk, Reliability and Quality
- Q2 Atomic and Molecular Physics, and Optics
- Q2 Electronic, Optical and Magnetic Materials
SJR
SJR
SCImago Journal Rank measures weighted citations received by the serial. Citation weighting depends on subject field and prestige (SJR) of the citing serial.
0.85
SNIP
SNIP
Source Normalized Impact per Paper measures actual citations received relative to citations expected for the serial’s subject field.
4 Mo
Time to Publish
Time to Publish
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
Journal Specifications
| Overview | |
| Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
| Language | English |
| Frequency | Monthly |
| General Details | |
| Language | English |
| Frequency | Monthly |
| Publication Start Year | 1962 |
| Publisher URL | Visit website |
| Website URL | Visit website |
Planning to publish in Microelectronics Reliability ?
Upload your Manuscript to get
- Degree of match
- Common matching concepts
- Additional journal recommendations
Looking for the right journals to submit your mansucript?
Upload your manuscript and get a submission readiness score and other journal recommendations.
Check my PaperRecently Published Papers
-
Full paper
Inside front cover - Editorial board
- 1 May 15
- Microelectronics Reliability
-
Full paper
Development of embedded piezoelectric acoustic sensor array architecture
- 1 Jun 10
- Microelectronics Reliability
-
Full paper
Moisture effect on the dielectric and structure of BaTiO3-based devices
- 1 Jun 10
- Microelectronics Reliability
-
Full paper
Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances
- 1 Jun 10
- Microelectronics Reliability
-
Full paper
Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
- 1 Jun 10
- Microelectronics Reliability
-
Full paper
Functional fluid jetting performance optimization
- 1 Jun 10
- Microelectronics Reliability
Scite analysis
Powered by scite_
30k articles received 57.1k citations see all
- 1,422 Supporting
- 54,952 Mentioning
- 102 Contrasting
Editorial notices
- 2 Retractions
- 8 Withdrawals
- 0 Corrections
- 6 Errata
- 0 Expression of Concern
Time To Publish
Time to Publish
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
Time to Publish
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
% of papers by time taken from submission to publication
0 to 3 months
12%
4 to 6 months
60%
7 to 9 months
18%
Above 9 months
10%
Did you find this useful?
Thank you for your feedback.
FAQs
How long has Microelectronics Reliability been actively publishing?
Microelectronics Reliability has been in operation since 1962 till date.
What is the publishing frequency of Microelectronics Reliability ?
Microelectronics Reliability published with a Monthly frequency.
How many articles did Microelectronics Reliability publish last years ?
In 2023, Microelectronics Reliability published articles.
What is the eISSN & pISSN for Microelectronics Reliability ?
For Microelectronics Reliability,eISSN is 1872-941X and pISSN is0026-2714.
What is Citescore for Microelectronics Reliability ?
Citescore for Microelectronics Reliability is 3.5.
What is SNIP score for Microelectronics Reliability ?
SNIP score for Microelectronics Reliability is 0.85.
What is the SJR for Microelectronics Reliability ?
SJR for Microelectronics Reliability is Q2.
Who is the publisher of Microelectronics Reliability ?
PERGAMON-ELSEVIER SCIENCE LTD is the publisher of Microelectronics Reliability.