CiteScore measures average citations received per document published in the serial.
Impact factor of a journal is calculated by dividing the number of current year citations to the source items published in that journal during the previous two years.
Journal's h-index reflects the collective citation impact of the authors publishing in the journal. The h-index is defined as the maximum value of h such that the given journal has published at least h papers that have each been cited at least h times.
SCImago Journal Rank measures weighted citations received by the serial. Citation weighting depends on subject field and prestige (SJR) of the citing serial.
Source Normalized Impact per Paper measures actual citations received relative to citations expected for the serial’s subject field.
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Overview | |
Publisher | IOS PRESS |
Language | English |
Frequency | Bi-monthly |
General Details | |
Language | English |
Frequency | Bi-monthly |
Publication Start Year | 1988 |
Publisher URL | Visit website |
Website URL | Visit website |
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Check my Paper1.4k articles received 5.2k citations see all
Journal of X-Ray Science and Technology has been in operation since 1988 till date.
Journal of X-Ray Science and Technology published with a Bi-monthly frequency.
In 2023, Journal of X-Ray Science and Technology published 84 articles.
For Journal of X-Ray Science and Technology,eISSN is 1095-9114 and pISSN is0895-3996.
Citescore for Journal of X-Ray Science and Technology is 2.9.
H index for Journal of X-Ray Science and Technology is 38.
SNIP score for Journal of X-Ray Science and Technology is 0.75.
SJR for Journal of X-Ray Science and Technology is Q2.
IOS PRESS is the publisher of Journal of X-Ray Science and Technology.