Key Metrics
1.8
CiteScore
CiteScore
CiteScore measures average citations received per document published in the serial.
0.59
SNIP
SNIP
Source Normalized Impact per Paper measures actual citations received relative to citations expected for the serial’s subject field.
6 Mo
Time to Publish
Time to Publish
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
Time To Publish
Time to Publish
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
Time to Publish
Based on turnaround time from submission to publication for papers (articles & reviews) published in 2022 and for journals with a sample of more than 10 papers.
% of papers by time taken from submission to publication
0 to 3 months
16%
4 to 6 months
44%
7 to 9 months
27%
Above 9 months
13%
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Indexed in the following public directories
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Web of Science -
Inspec -
SJR
Journal Specifications
| Overview | |
| Publisher | SPRINGER |
| Language | English |
| Frequency | Bi-monthly |
| General Details | |
| Language | English |
| Frequency | Bi-monthly |
| Publication Start Year | 1990 |
| Publisher URL | Visit website |
| Website URL | Visit website |
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Check my PaperRecently Published Papers
-
Full paper
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization
- 13 Nov 24
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Full paper
Fatigue Life Based Study of Electronic Package Mounting Locations on Printed Circuit Boards Subjected to Random Vibration Loads
- 7 Nov 24
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Full paper
YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards
- 5 Nov 24
- Journal of Electronic Testing
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Full paper
A Novel Two-Stage Model Based SCA against secAES
- 31 Oct 24
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Full paper
Editorial
- 28 Oct 24
- Journal of Electronic Testing
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Full paper
Test Modules for Enhanced Testability of Single Flux Quantum Integrated Circuits
- 24 Oct 24
- Journal of Electronic Testing
Scite analysis
Powered by scite_
2.1k articles received 4.7k citations see all
- 29 Supporting
- 4,589 Mentioning
- 0 Contrasting
Editorial notices
- 0 Retractions
- 0 Withdrawals
- 3 Corrections
- 3 Errata
- 0 Expression of Concern
FAQs
How long has Journal of Electronic Testing: Theory and Applications (JETTA) been actively publishing?
Journal of Electronic Testing: Theory and Applications (JETTA) has been in operation since 1990 till date.
What is the publishing frequency of Journal of Electronic Testing: Theory and Applications (JETTA) ?
Journal of Electronic Testing: Theory and Applications (JETTA) published with a Bi-monthly frequency.
How many articles did Journal of Electronic Testing: Theory and Applications (JETTA) publish last years ?
In 2023, Journal of Electronic Testing: Theory and Applications (JETTA) published 54 articles.
What is the eISSN & pISSN for Journal of Electronic Testing: Theory and Applications (JETTA) ?
For Journal of Electronic Testing: Theory and Applications (JETTA),eISSN is 1573-0727 and pISSN is0923-8174.
What is Citescore for Journal of Electronic Testing: Theory and Applications (JETTA) ?
Citescore for Journal of Electronic Testing: Theory and Applications (JETTA) is 1.8.
What is SNIP score for Journal of Electronic Testing: Theory and Applications (JETTA) ?
SNIP score for Journal of Electronic Testing: Theory and Applications (JETTA) is 0.59.
Who is the publisher of Journal of Electronic Testing: Theory and Applications (JETTA) ?
SPRINGER is the publisher of Journal of Electronic Testing: Theory and Applications (JETTA).