Key Metrics
5.5
CiteScore
CiteScore
CiteScore measures average citations received per document published in the serial.
< 5
Impact Factor
Impact Factor
Impact factor of a journal is calculated by dividing the number of current year citations to the source items published in that journal during the previous two years.
Q2
Computer Science Applications
SJR
- Q2 Computer Science Applications
- Q2 Electrical and Electronic Engineering
SJR
SJR
SCImago Journal Rank measures weighted citations received by the serial. Citation weighting depends on subject field and prestige (SJR) of the citing serial.
1.04
SNIP
SNIP
Source Normalized Impact per Paper measures actual citations received relative to citations expected for the serial’s subject field.
Topics Covered
- Heterojunction
- Simulation
- Resistive switching memory
- Room temperature
- Biosensor
- Drain current
- Sensitivity analysis
- Quantum efficiency
- Graphene nanoribbons
- Transition metal
- High frequency
- Exciton
- Reflection coefficient
- Pentacene
- Composite beams
- Crossbar array
- Amplitude
- Energy harvesting
- Akkermansia muciniphila
- Oxygen doping
Journal Specifications
| Overview | |
| Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| Language | English |
| Frequency | Bi-monthly |
| General Details | |
| Language | English |
| Frequency | Bi-monthly |
| Publication Start Year | 2002 |
| Publisher URL | Visit website |
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Check my PaperRecently Published Papers
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Full paper
Iron-Ion Nanoparticles for Smart and Cost-Effective Energy Storage Cell Electrode Integration Using Novel Nano-Sedimentation Method
- 1 Jan 25
- IEEE Transactions on Nanotechnology
-
Full paper
Dynamic Analysis of the Effect of the Device-to-Device Variability of Real-World Memristors on the Implementation of Uncoupled Memristive Cellular Nonlinear Networks
- 1 Jan 25
- IEEE Transactions on Nanotechnology
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Full paper
Improvement of Surface Roughness in SiO<sub>2</sub> Thin Films via Deuterium Annealing at 300 °C
- 1 Jan 25
- IEEE Transactions on Nanotechnology
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Full paper
Unveiling the Impact of Interfacial Trap Charges on Strained VS-FeFinFETs for Improved Reliability:Device to Circuit Level Assessment
- 1 Jan 25
- IEEE Transactions on Nanotechnology
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Full paper
Insights Into Temperature sensitivity Analysis of Polarity Controlled Charge Plasma Based Tunable Arsenide/Antimonide Tunneling Interfaced Junctionless TFET
- 1 Jan 25
- IEEE Transactions on Nanotechnology
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Full paper
Demonstration of a Ternary Inverter Based on the Novel TDDFET with Dual-Doped Source and Asymmetric Gates
- 1 Jan 25
- IEEE Transactions on Nanotechnology
Scite analysis
Powered by scite_
3.4k articles received 35.1k citations see all
- 707 Supporting
- 34,059 Mentioning
- 66 Contrasting
Editorial notices
- 1 Retractions
- 0 Withdrawals
- 0 Corrections
- 0 Errata
- 0 Expression of Concern
FAQs
How long has IEEE Transactions on Nanotechnology been actively publishing?
IEEE Transactions on Nanotechnology has been in operation since 2002 till date.
What is the publishing frequency of IEEE Transactions on Nanotechnology ?
IEEE Transactions on Nanotechnology published with a Bi-monthly frequency.
How many articles did IEEE Transactions on Nanotechnology publish last years ?
In 2024, IEEE Transactions on Nanotechnology published 119 articles.
What is the eISSN & pISSN for IEEE Transactions on Nanotechnology ?
For IEEE Transactions on Nanotechnology,eISSN is 1941-0085 and pISSN is1536-125X.
What is Citescore for IEEE Transactions on Nanotechnology ?
Citescore for IEEE Transactions on Nanotechnology is 5.5.
What is SNIP score for IEEE Transactions on Nanotechnology ?
SNIP score for IEEE Transactions on Nanotechnology is 1.04.
What is the SJR for IEEE Transactions on Nanotechnology ?
SJR for IEEE Transactions on Nanotechnology is Q2.
Who is the publisher of IEEE Transactions on Nanotechnology ?
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC is the publisher of IEEE Transactions on Nanotechnology.