CiteScore measures average citations received per document published in the serial.
SCImago Journal Rank measures weighted citations received by the serial. Citation weighting depends on subject field and prestige (SJR) of the citing serial.
Source Normalized Impact per Paper measures actual citations received relative to citations expected for the serial’s subject field.
Overview | |
Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
Language | English |
Frequency | Bi-monthly |
General Details | |
Language | English |
Frequency | Bi-monthly |
Publication Start Year | 2013 |
Publisher URL | Visit website |
Website URL | Visit website |
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IEEE Design and Test has been in operation since 2013 till date.
IEEE Design and Test published with a Bi-monthly frequency.
For IEEE Design and Test,eISSN is 2168-2364 and pISSN is2168-2356.
Citescore for IEEE Design and Test is 3.3.
SNIP score for IEEE Design and Test is 0.96.
SJR for IEEE Design and Test is Q2.
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC is the publisher of IEEE Design and Test.