Nanomanufacturing and Metrology : Impact Factor & More
eISSN: 2520-8128pISSN: 2520-811X
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Key Metrics
CiteScore 
6.2
SJR
Q1Mechanical Engineering
SNIP
1.54
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Topics Covered on Nanomanufacturing and Metrology
Nanomanufacturing and Metrology Journal Specifications
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| Publisher | Springer Nature |
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Recently Published Papers in Nanomanufacturing and Metrology
Chip Formation Model for Orthogonal Diamond Turning of PMMA Using Coupled Eulerian–Lagrangian Approach
- 27 Apr 2026
- Nanomanufacturing and Metrology
Tribological Behavior of β-Ga2O3 Under Oxidative Aqueous Environment
- 20 Apr 2026
- Nanomanufacturing and Metrology
Atomic Layer Etching for Extreme Manufacturing: Pushing the Limits of Atomic Scale Precision
- 23 Mar 2026
- Nanomanufacturing and Metrology
Laser-Assisted Mass Transfer Technology for Microlight-Emitting Diodes
- 13 Feb 2026
- Nanomanufacturing and Metrology
Structural Optimization of an Inductively Coupled Plasma Torch for Enhanced Jet Stability in Optical Fabrication
- 26 Jan 2026
- Nanomanufacturing and Metrology
Towards an Electrode Dressing-Free Micro Electrical Discharge Machining Approach for the Fabrication of Ellipse Dimple Textures
- 26 Jan 2026
- Nanomanufacturing and Metrology
Chip Formation Model for Orthogonal Diamond Turning of PMMA Using Coupled Eulerian–Lagrangian Approach
- 27 Apr 2026
- Nanomanufacturing and Metrology
Tribological Behavior of β-Ga2O3 Under Oxidative Aqueous Environment
- 20 Apr 2026
- Nanomanufacturing and Metrology
Atomic Layer Etching for Extreme Manufacturing: Pushing the Limits of Atomic Scale Precision
- 23 Mar 2026
- Nanomanufacturing and Metrology
Laser-Assisted Mass Transfer Technology for Microlight-Emitting Diodes
- 13 Feb 2026
- Nanomanufacturing and Metrology
Structural Optimization of an Inductively Coupled Plasma Torch for Enhanced Jet Stability in Optical Fabrication
- 26 Jan 2026
- Nanomanufacturing and Metrology
Towards an Electrode Dressing-Free Micro Electrical Discharge Machining Approach for the Fabrication of Ellipse Dimple Textures
- 26 Jan 2026
- Nanomanufacturing and Metrology
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