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Journal of Intelligent Manufacturing : Impact Factor & More

eISSN: 1572-8145pISSN: 0956-5515

Key Metrics

CiteScore
13.3
Eigenfactor
0.005 - 0.01
Impact Factor
5 - 10
SJR
Q1Software
SNIP
2.69
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Journal of Intelligent Manufacturing Journal Specifications

Overview
Publisher SPRINGER
Language English
Frequency Bi-monthly
General Details
LanguageEnglish
FrequencyBi-monthly
Publication Start Year1990
Publisher URLVisit website
Website URLVisit website
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Recently Published Papers in Journal of Intelligent Manufacturing

Application of machine learning for in-situ defect detection in metal powder bed fusion: a critical review
  • 5 May 2026
  • Journal of Intelligent Manufacturing
In-situ sensor monitoring of multi-class gas porosity formation in laser powder bed fusion using convolutional neural network
  • 24 Apr 2026
  • Journal of Intelligent Manufacturing
Graph construction optimized Siamese graph neural network for robust fault diagnosis under few-shot and strong noise conditions
  • 24 Apr 2026
  • Journal of Intelligent Manufacturing
Correction: Process data-driven machine learning for non-uniformity prediction and virtual metrology in chemical mechanical planarization
  • 21 Apr 2026
  • Journal of Intelligent Manufacturing
Review of wafer defect detection in semiconductor manufacturing: Algorithms, systems, and data
  • 21 Apr 2026
  • Journal of Intelligent Manufacturing
Digital twin for flatness control of cold-rolled copper strip and mechanistic model of work roll multi-zone cooling
  • 21 Apr 2026
  • Journal of Intelligent Manufacturing
Application of machine learning for in-situ defect detection in metal powder bed fusion: a critical review
  • 5 May 2026
  • Journal of Intelligent Manufacturing
In-situ sensor monitoring of multi-class gas porosity formation in laser powder bed fusion using convolutional neural network
  • 24 Apr 2026
  • Journal of Intelligent Manufacturing
Graph construction optimized Siamese graph neural network for robust fault diagnosis under few-shot and strong noise conditions
  • 24 Apr 2026
  • Journal of Intelligent Manufacturing
Correction: Process data-driven machine learning for non-uniformity prediction and virtual metrology in chemical mechanical planarization
  • 21 Apr 2026
  • Journal of Intelligent Manufacturing
Review of wafer defect detection in semiconductor manufacturing: Algorithms, systems, and data
  • 21 Apr 2026
  • Journal of Intelligent Manufacturing
Digital twin for flatness control of cold-rolled copper strip and mechanistic model of work roll multi-zone cooling
  • 21 Apr 2026
  • Journal of Intelligent Manufacturing

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